[5] Matt Young, Eric G. Johnson, Jr. Richard Goldgraben. Tunable scratch standards. Proc. SPIE, 1985, 525∶ 70~77
[6] L. R. Baker. On-machine measurement of roughness, waviness and flaws. Proc. SPIE, 1992, 1333∶ 248~256
[7] Matt Young. Objective measurement and characterization of scratch standards. Proc. SPIE, 1982, 362∶ 82~92
[8] Horst Truckenbrodt Angela Duparré and Uwe Schuhmann. Roughness and defect characterization of optical surfaces by light scattering measurements. Proc. SPIE, 1992, 1781∶ 139~151
[9] L. R. Baker. Thresholds for surface imperfections. Opt. Eng., 1994, 33(8)∶ 2800~2802
[10] J. C. Stover. Optical Scattering: Measurement and Analysis. New York, McGraw-Hill, 1990∶ 67~75