Jiaqi Wen, Jintian Bian, Xin Li, Hui Kong, Lei Guo, Guorui Lv. Research progress of laser dazzle and damage CMOS image sensor (invited)[J]. Infrared and Laser Engineering, 2023, 52(6): 20230269
- Infrared and Laser Engineering
- Vol. 52, Issue 6, 20230269 (2023)
Fig. 1. Effect of pulsed laser parameters on damage
![(a) Pixel structures of passive pixel CMOS and (b) active pixel CMOS[13]](/richHtml/irla/2023/52/6/20230269/img_2.jpg)
Fig. 2. (a) Pixel structures of passive pixel CMOS and (b) active pixel CMOS[13]
![DTI between CMOS pixels[15]](/Images/icon/loading.gif){kind=icon}
Fig. 3. DTI between CMOS pixels[15]
Fig. 4. Schematic of the structure of the Front Side Illuminated CMOS image sensor[5]
Fig. 5. Comparison of pixel structures between the FSI-CMOS and BSI-CMOS. (a) Front lighting structure; (b) Back lighting structure
Fig. 6. Correlated double sampling working process of CMOS pixels[16]
Fig. 7. Curve of interference area with incident laser energy density[4]
Fig. 8. Comparison of irreversible damage to CMOS and CCD by nanosecond laser[24]
Fig. 9. Comparison of morphology of CMOS surface damage induced by different lasers[24]. (a) Morphology of picosecond laser damage; (b) Morphology of femtosecond laser damage
Fig. 10. Comparison of damage to CCD, FSI-CMOS and BSI-CMOS[11]
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Table 1. Comparison of laser interference thresholds for CMOS image sensors
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Table 2. Comparison of laser damage thresholds for CMOS image sensors
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