[1] TANG C W, Van SLYK SA. AppL. Phys. Lett., 1987, 51： 913.

[2] Baldo M A, O’Brien D F, You Y, et al. Nature, 1998, 395: 151.

[3] Baldo M A, Thomspon M E, Forrest S R. Nature, 2000, 403: 750.

[4] 2004, 85： 3911.

     He Gufeng, Pfeiffer Martin, Leo Karl, et al. Appl. Phys. Lett.,

[5] Lee Jun Yeob. AppL. Phys. Lett., 2006, 89： 223517.

[6] 157： 228.

     Hyun Kima Sung, Jang Jyongsik, Lee Jun Yeob. Synth. Metals, 2007,

[7] Xin Q, Li W L, Su W M, et al. J. Appl. Phys., 2007, 101, 044512.

[8] Adachi C, Baldo M A, Forrest S R. J. Appl. Phys., 2000, 87: 8049.

[9] 5357.

     Heil H, Steiger J, Schmechel R, et al. J. Appl. Phys., 2001, 90：

[10] Sun P P, Duan J P, Shih H T, et al. Appl. Phys. Lett., 2002, 77：

     792.

[11] Uchida M, Adachi C, Koyama T, et al. J. Appl. Phys., 1999, 86：

     1680.

[13] Reineke S, Walzer K, Leo K. Phys. Review B, 2007, 75： 125328.

[14] Giebink N C, Sun Y, Forrest S R. Organic Electronics, 2006, 7: 375.

[15] 2006, 7： 163.

     Holmes R J, Forrest S R, Sajoto T, et al. Organic Electronics,