Contents
1999
Volume: 26 Issue 11
20 Article(s)

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Research Article
Determining the Residual Nonlinear Error of a Dual-Frequency Interferometer for Nanometrology
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Chinese Journal of Lasers
  • Publication Date: Jan. 01, 1900
  • Vol. 26, Issue 11, 987 (1999)
Holography and Information Processing
Laser Manufacturing
Laser Physics