[1] ZHON Zheng-gan, SUN Guang-kai, MA Bao-quan, et al. Application of new developed techniques for ultrasonic nondestructive testing for advanced composite materials[J]. Science & Technology Review, 2014, 32(9): 15-20.
[2] DONG Fang-xu, WANG Cong-ke, FAN Li-mei,et al. The application and development of detection of composite materials by X-ray nondestructive testing techniques [J]. Nondestructive Testing, 2016, 38(2): 67-72.
[4] WU Xin-jin; ZHANG Qing; SHEN Gong-tian. Review on advances in pulsed eddy current nondesttrutive testing technology [J]. Chinese Journal of Scientific Instrument,2016,37(8): 1698-1712.
[5] ZHAO Q H, DAN X Z, SUN F Y,et al. Digital shearography for NDT: phase measurement technique and recent developments [J]. Applied Sciences, 2018, 8(12): 2662.
[7] HUNG Y Y. Shearography: a new optical method for strain measurement and nondestructive testing[J].Optical Engineering, 1982, 21(3): 391-395.
[8] WANG Y, THOMAS D, ZHANG P,et al. Whole field strain measurement on complex surfaces by digital speckle pattern interferometry.[J]. Materials Evaluation, 2008, 66(5): 507-512.
[11] LIU Chen, LU Rong-sheng CHEN Lei, et al. Progress of surface roughness measurement based on optical method[J]. Semiconductor Optoelectronics, 2010,31(4): 495-500.
[12] WANG Xiao-mu, XIAO Yu-bin, XU Jian-bin. Graphene with scanning probe microscopy: A review[J].Journal of Chinese Electron Microscopy Society,2012,31(1): 74-8.
[13] XU N , XIE X , CHEN X , et al. Shearography for specular object inspection[J]. Optics and Lasers in Engineering, 2014, 61: 14-18.
[15] LIU Ying-xue, WANG Yong-hong, GAO Xin-ya,et al. Research on phase measurement technologies in speckle pattern interferometry[J]. Tool Engineering, 2016, 50(9): 89-94.
[18] WANG Y, GAO X, XIN X, et al. Simultaneous dual directional strain measurement using spatial phase-shift digital shearography[J]. Optics & Lasers in Engineering, 2016, 87: 197-203.
[19] LIU Kai, WU Si-jin, GAO Xin-ya,et al. Research on the key parameters of optical path for spatial-carrier digital speckle pattern interference[J]. Process Automation Instrumentation, 2015, 36(9): 38-41.