Shunmin Pan, Yaowei Wei, Chenhui An, Zhenfei Luo, Jian Wang. Electric field enhancement effect and damage characteristics of nodular defect in 45° high-reflection coating[J]. High Power Laser and Particle Beams, 2020, 32(7): 071006
- High Power Laser and Particle Beams
- Vol. 32, Issue 7, 071006 (2020)
Fig. 1. Electric field intensity （EFI） distribution of 45° HR coating
Fig. 2. Electric field enhancement effects of nodules with different diameters under s and p polarized light irradiation
Fig. 3. Morphology of artificial nodule（seed diameter: 2 μm）
Fig. 4. The minimum and maximum laser damage energies of samples
Fig. 5. Morphologyies of coating damage spots
Fig. 6. Damage morphology of sample C
Fig. 7. Damage spot produced by micro defect ejection
Fig. 8. Surface morphology and cross-section images of nodule pits
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Table 1. The electric field intensity in different regions
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Table 2. Sample parameters
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