Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 22 >Issue 7 >Page 752 > Article
    • Journal of Terahertz Science and Electronic Information Technology
    • Vol. 22, Issue 7, 752 (2024)
    Risk assessment method for electromagnetic spectrum parameter leakage of frequency equipment
    YAN Jun, LIU Qing*, and ZHANG Jiangming
    Author Affiliations
  • [in Chinese]
    • show less
    DOI: 10.11805/tkyda2023004 Cite this Article
    YAN Jun, LIU Qing, ZHANG Jiangming. Risk assessment method for electromagnetic spectrum parameter leakage of frequency equipment[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(7): 752 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    YAN Jun, LIU Qing, ZHANG Jiangming. Risk assessment method for electromagnetic spectrum parameter leakage of frequency equipment[J]. Journal of Terahertz Science and Electronic Information Technology , 2024, 22(7): 752
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology