• Chinese Optics Letters
  • Vol. 7, Issue 11, 1031 (2009)
Lihua Huang1、2, Youbao Zhang1, Chengke Xie1、2, Jianfeng Qu1, Huijie Huang1, and Xiangzhao Wang1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/COL20090711.1031 Cite this Article Set citation alerts
    Lihua Huang, Youbao Zhang, Chengke Xie, Jianfeng Qu, Huijie Huang, Xiangzhao Wang. Theoretical model and quantif ication of reflectance photometer[J]. Chinese Optics Letters, 2009, 7(11): 1031 Copy Citation Text show less
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    Data from CrossRef

    [1] J. Noble, S. Attree, A. Horgan, A. Knight, N. Kumarswami, R. Porter, G. Worsley. Optical Scattering Artifacts Observed in the Development of Multiplexed Surface Enhanced Raman Spectroscopy Nanotag Immunoassays. Analytical Chemistry, 84, 8246(2012).

    Lihua Huang, Youbao Zhang, Chengke Xie, Jianfeng Qu, Huijie Huang, Xiangzhao Wang. Theoretical model and quantif ication of reflectance photometer[J]. Chinese Optics Letters, 2009, 7(11): 1031
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