Growth and characterization of Mg2SiO4:Cr3+single crystals

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 17 >Issue 6 >Page 365 > Article

Chinese Journal of Lasers
Vol. 17, Issue 6, 365 (1990)

Growth and characterization of Mg₂SiO₄:Cr³⁺single crystals

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Growth and characterization of Mg₂SiO₄:Cr³⁺single crystals[J]. Chinese Journal of Lasers, 1990, 17(6): 365 Copy Citation Text

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Abstract

Mg2SiO4:Cr3+ single crystals were growh by Czoehralski method for the first time in China. Characterization of crystal growth, its structure and morphology wre described. The absorption spectrum and fluorescence spectrum of Mg2SiO4:Cr were measured. Vibronic side band of the fluorescence spectrum in our Cr3+:Mg2SiO4 crystals ranges from 800nm to 1400nm and the absorption band of Fe3+ wore observed.

Keywords

Czochralski method Mg2SiO4:Cr3+

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