• Acta Physica Sinica
  • Vol. 68, Issue 23, 239401-1 (2019)
Guo-Chang Li1、2 and Sheng-Tao Li2、*
Author Affiliations
  • 1Institute of Advanced Electrical Materials, Qingdao University of Science and Technology, Qingdao 266042, China
  • 2State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
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    DOI: 10.7498/aps.68.20191252 Cite this Article
    Guo-Chang Li, Sheng-Tao Li. Review of charge deposition characteristics and trap parameters of dielectric in space electron radiation environment[J]. Acta Physica Sinica, 2019, 68(23): 239401-1 Copy Citation Text show less
    References

    [1] Lai S T[J]. Fundamentals of Spacecraft Charging, 156-167(2011).

    [2] 黎树添 著 李盛涛, 郑晓泉, 陈玉, 闵道敏 译[J]. Fundamentals of Spacecraft Charging, 135-141(2015).

    [3] Gupta S B, Kalaria K R, Vaghela N P[J]. IEEE Trans. Plasma Sci., 42, 1072(2014).

    [4] Li S T, Li G C[J]. Chin. Sci. Bull., 62, 990(2017).

    [5] Koons H C, Mazur J E, Selesnick R S, Blake J B, Frnnell J F, Rober J L, Anderson P C[J]. 6th Spacecraft Charging Technology Conference, 7(2000).

    [6] Zhou Y X, Wang N H, Wang Y S, Sun Q, Liang X D, Guan Z C[J]. Transactions of China Electrotechnical Society, 23, 16(2008).

    [7] Xin X L, Wu G N, Xu H H, Luo Y, Cao K J[J]. Insulating Materials, 44, 59(2011).

    [8] Li G C, Li S T, Min D M, Zhu Y W[J]. Sci. China, 43, 375(2013).

    [9] Liao R J, Zhou T C, Chen G, Chen G, Yang L J[J]. Acta Phys. Sin., 61, 017201(2012).

    [10] Zhou T C, Chen G, Liao R J, Xu Z Q[J]. J. Appl. Phys., 110, 043724(2009).

    [11] Laurent C, Teyssedre G, Le R S, Baudoin F[J]. IEEE Trans. Dielectr. Electr. Insul., 20, 357(2013).

    [12] Yang B T, Tu D M, Liu Y N[J]. J. Appl. Phys., 10, 233(1992).

    [13] Haque N, Dalai S, Chatterjee B, Chakravorti S[J]. IEEE Trans. Electr. Insul., 24, 1896(2017).

    [14] Din D M, Mengu C, Arifur R K, Li S T[J]. IEEE Trans. Dielectr. Electr. Insul., 19, 600(2012).

    [15] Severine L R, Teyssedre G, Laurent C, Segur P[J]. J. Phys. D: Appl. Phys., 39, 298(2006).

    [16] Perrin C, Griseri V, Laurent C, Fukunaga K, Maeno T, Levy L, Payan D, Schwander D[J]. High Performance Polymers, 20, 535(2008).

    [17] Perrin C, Griseri V, Laurent C, Fukunaga K[J]. IEEE Trans. Dielectr. Electr. Insul., 15, 958(2008).

    [18] Griseri V, Fukunaga K, Maeno T, Laurent C, Levy L[J]. IEEE Trans. Dielectr. Electr. Insul., 11, 891(2004).

    [19] Hodges J L, Dennison J R, Dekany J, Wilson G, Evans A, Sim A[J]. IEEE Trans. Plasma Sci., 42, 255(2014).

    [20] Dennison J R, Brunson J, Swaminathan P, Green N W, Frederickson A R[J]. IEEE Trans. Plasma Sci., 34, 2191(2006).

    [21] Huang J G, Chen D[J]. Chin. J. Geophys., 47, 392(2004).

    [22] Huang J G, Chen D[J]. Acta Phys. Sin., 53, 961(2004).

    [23] Quan R H, Han J W, Zhang Z L[J]. Acta Phys. Sin., 64, 245205(2013).

    [24] Qin X G, He D Y, Wang J[J]. Acta Phys. Sin., 58, 684(2009).

    [25] Chen Y F, Yang S S, Qin X G, Liu Q, Shi L, Kong F L, Tang D T, Li C H[J]. Vacuum and Cryogenics, 16, 167(2010).

    [26] Li S T, Li G C, Min D M, Zhao N[J]. Acta Phys. Sin., 62, 059401(2013).

    [27] Li G C, Min D M, Li S T, Zheng X Q, Ru J S[J]. Acta Phys. Sin., 63, 209401(2014).

    [28] Li G C[J]. Ph. D. Dissertation(2017).

    [29] Li W Q, Hao J, Zhang H B[J]. Acta Phys. Sin., 64, 086801(2015).

    [30] Yi Z, Wang S, Tang X J, Wu Z C, Zhang C[J]. Acta Phys. Sin., 64, 125201(2015).

    [31] Cao H F, Liu S H, Sun Y W, Yuan Q Y[J]. Acta Phys. Sin., 62, 149402(2013).

    [32] Cao H F, Liu S F, Sun Y W, Yuan Q Y[J]. Acta Phys. Sin., 62, 149401(2013).

    [33] Fan Y J, Sun X J, Sun Y W, Zhou L D[J]. High Power Laser and Particle Beams., 30, 114002(2018).

    [34] Li G C, Li S T, Pan S M, Min D M[J]. IEEE Trans. Dielectr. Electr. Insul., 23, 2393(2016).

    [35] Min D M, Cho M, Li S T[J]. IEEE Trans. Dielectr. Electr. Insul., 19, 2206(2012).

    [36] Baudoin F, Le Roy S, Teyssedre G[J]. J. Phys. D: Appl. Phys., 41, 025306(2008).

    [37] Le Roy S, Baudoin F, Griseri V, Laurent C, Teyssedre G[J]. J. Phys. D: Appl. Phys., 43, 315402(2010).

    [38] Le Roy S, Baudoin F, Griseri V[J]. J. Appl. Phys., 112, 023704(2012).

    [39] Teyssedre G, Laurent C[J]. IEEE Trans. Dielectr. Electr. Insul., 12, 857(2005).

    [40] Boufayed F, Teyssèdre G, Laurent C[J]. J. Appl. Phys., 100, 104105(2006).

    [41] Liu X D, Zheng X Q, Zhang Y Q, Yang S S, Qin X G, Wang L[J]. Electrical and Electrical Technology, 26, 55(2007).

    [42] Ma L C, Zheng X Q, Liu X D, Zhang Y Q, Ma L C[J]. Proc. CSEE, 27, 32(2007).

    [43] Li G C, Li S T, Pan S M[J]. IEEE Trans. Dielectr. Electr. Insul., 23, 1846(2016).

    [44] Gao Y, Wang X F, Li N, Xu B B, Wang J L, Du B X[J]. High Voltage, 45, 2219(2019).

    [45] Shen W W, Mu H B, Zhang G J[J]. J. Appl. Phys., 113, 083706(2013).

    [46] Simmons J G, Tam M C[J]. Phys. Rev. B, 7, 3706(1973).

    [47] Wei Y H, Chen G, Zhang G J, Liu N, Li G C[J]. AIP Adv., 6, 075120(2016).

    [48] Zhang Z J, Miao J, Wang X Q, Wu W B, Yang P, Zheng X Q[J]. High Voltage Engineering, 40, 117(2014).

    Guo-Chang Li, Sheng-Tao Li. Review of charge deposition characteristics and trap parameters of dielectric in space electron radiation environment[J]. Acta Physica Sinica, 2019, 68(23): 239401-1
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