• Acta Photonica Sinica
  • Vol. 34, Issue 2, 214 (2005)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Improved Carrier-Wave Electric Speckle Interferometry[J]. Acta Photonica Sinica, 2005, 34(2): 214 Copy Citation Text show less
    References

    [2] Sirohi R S, Burke J,Helmers H,et al. Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry.1997,36(23):5787~5791

    [4] Jin Guanchang. Electronic speckle pattern interferometer with a polarization phase-shift technique. Opt Eng, 1992,31(4):857 ~ 860

    [6] Mitsuo Takeda, Hideki Ina and Seiji Kobayashi, Fouriertransform method of fringe pattern analysis for computerbased topography and interferometry. J Opt Soc Am, 1982,72(1): 156 ~ 160

    [7] Antonio F, Guilliermo H K, Angel F D,et al. Comparison of carrier removal methods in the analysis of TV holography fringes by the Fourier transform method. Opt Eng, 1998,37:2899

    CLP Journals

    [1] LIN Zhen-heng. A Method to Modulate Carrier-wave Speckle Pattern Fringe Based on Fringe Center[J]. Acta Photonica Sinica, 2013, 42(1): 19

    [in Chinese], [in Chinese], [in Chinese]. Improved Carrier-Wave Electric Speckle Interferometry[J]. Acta Photonica Sinica, 2005, 34(2): 214
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