• Acta Photonica Sinica
  • Vol. 39, Issue 6, 1125 (2010)
HE Jun1、2, CHEN Lei1、2、*, and WANG Qing1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    HE Jun, CHEN Lei, WANG Qing. Measurements of Infrared Materials Refractive-index Using Infrared Interferometer[J]. Acta Photonica Sinica, 2010, 39(6): 1125 Copy Citation Text show less
    References

    [1] EDWIN R P,DUDERMEL M T,LAMARE M.Refractive index measurements of ten germanium samples[J].Appl Opt,1982,21(5):878-881.

    [2] ZHENG Ke-zhe,WANG Jiang-gang,ZHU Ming-gui,et al.An instrument of measuring IR refractive index[J].Journal of Applied Optics,2001,22(2):24-27.

    [3] Mr BRADY C.Optical testing of infrared materials and component[C].SPIE,1988,916:112-119.

    [4] GILLEN G D,GUHA S.Refractive-index measurements of zinc germanium diphosphide at 300 and 77K by use of a modified Michelson interferometer[J].Appl Opt,2004,43(10):2054-2058.

    [5] GILLEN G D,GUHA S.Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers[J].Appl Opt,2005,44(3):344-347.

    [6] HE Jun,WANG Qin,CHEN Lei.Alignment of Twyman-Green infrared phase-shifting interferometer[J].Infrared and Laser Engineering,2008,37(3):516-520.

    [7] YU Huai-zhi.Infrared optics materials[M].Beijing:National Defense Industry Press,2007:55,108.

    [8] ALEXANDROV S A,CHERNYH I V.Interference method for determination of the refractive index and thickness[J].Opt Eng,2000,39(9):2480-2486.

    HE Jun, CHEN Lei, WANG Qing. Measurements of Infrared Materials Refractive-index Using Infrared Interferometer[J]. Acta Photonica Sinica, 2010, 39(6): 1125
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