Yue YU, Tong SHEN, Qinghan ZHANG, Jihong ZHENG. Design and research of plate superlens based on GaP photonic crystal[J]. Optical Instruments, 2023, 45(6): 33

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- Optical Instruments
- Vol. 45, Issue 6, 33 (2023)

Fig. 1. PC superlens structure

Fig. 2. Simulation of 3D view of band structure

Fig. 3. Structural refractive index

Fig. 4. TE mode band stucture

Fig. 5. TE mode light source

Fig. 6. The comparison chart before and after the removal of Au photonic crystal

Fig. 7. Schematic diagram of circular defect

Fig. 8. Schematic diagram after adding circular defect r = 0.3 μ m

Fig. 9. The Imaging diagram when the Circular defect radius r = 0.1 μ m

Fig. 10. Schematic diagram of rectangular defect structure

Fig. 11. The imaging diagram when rectangular defect Lx = 0.5 μ m, Ly = 1 μ m

Fig. 12. Schematic diagram when rectangular defect Lx = 0.5 μ m, Ly = 2 μ m

Fig. 13. Schematic diagram when rectangular defect Lx = 0.5 μ m, Ly = 0.8 μ m

Fig. 14. Schematic diagram of a semicircular defect

Fig. 15. Schematic diagram when semicircular defect r = 0.23 μ m

Fig. 16. The full width at half maximum diagram of original structure, half-circle defect, circular defect, rectangular defect

Fig. 17. The interference situation when the distance between the two light sources is d = 0

Fig. 18. Schematic diagram of the distance d = 0.556λ between two light sources

Fig. 19. The interference situation when the distance between the two light sources is d = 0.556λ
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Table 1. Schematic diagram of Drude model parameter setting
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Table 2. Comparison of maximum intensity at the focus in fig.6
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Table 3. Comparison of maximum intensity at the focus in fig.6 (a) and fig.8
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Table 4. Comparison of maximum intensity at the focus in fig.8 and fig.9
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Table 5. Comparison of maximum intensity at the focus in fig.8 and fig.11
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Table 6. Comparison of maximum intensity at the focus in fig.11 and fig.12
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Table 7. Comparison of maximum intensity at the focus in fig.11 and fig.13
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Table 8. The full width at half maximum to the original structure and the three defects with the best imaging quality

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