• Acta Physica Sinica
  • Vol. 68, Issue 19, 194206-1 (2019)
Huai-Meng Gui1、2 and Wei Shi2、*
Author Affiliations
  • 1College Information Engineering, Shaanxi Polytechnic Institute, Xianyang 712000, China
  • 2Department of Applied Physics, Xi’an University of Technology, Xi’an 710048, China
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    DOI: 10.7498/aps.68.20190321 Cite this Article
    Huai-Meng Gui, Wei Shi. Effect of capacitance on positive and negative symmetric pulse with fast rising edge based on GaAsphotoconductive semiconductor switch[J]. Acta Physica Sinica, 2019, 68(19): 194206-1 Copy Citation Text show less
    Schematic diagram of GaAs PCSS.GaAs PCSS结构图
    Fig. 1. Schematic diagram of GaAs PCSS.GaAs PCSS结构图
    Schematic diagram of scanning circuit.扫描电路结构图
    Fig. 2. Schematic diagram of scanning circuit.扫描电路结构图
    Testing test circuit of scanning circuit.扫描电路测试电路图
    Fig. 3. Testing test circuit of scanning circuit.扫描电路测试电路图
    The output waveforms of 33 pF capacitor at the bias voltage is ± 1.9 kV.储能电容为33 pF, 偏置电压为± 1.9 kV时的输出波形图
    Fig. 4. The output waveforms of 33 pF capacitor at the bias voltage is ± 1.9 kV.储能电容为33 pF, 偏置电压为± 1.9 kV时的输出波形图
    The output waveforms at the bias voltage is ± 2.0 kV(insert is rising edge output waveform).外加偏置电压为± 2.0 kV时的输出波形图(插图为上升沿波形图)
    Fig. 5. The output waveforms at the bias voltage is ± 2.0 kV(insert is rising edge output waveform).外加偏置电压为± 2.0 kV时的输出波形图(插图为上升沿波形图)
    电容容值/pF传输效率/%
    ± 1.5 kV± 1.7 kV± 1.9 kV± 2.0 kV
    1050.447.246.944.3
    3372.471.168.566.2
    8278.676.273.972.1
    10089.392.292.992.6
    Table 1. The voltage transmission efficiency of output waveformwith different energy storage capacitor.
    电容容值/pF上升时间/ps
    ± 1.5 kV± 1.7 kV± 1.9 kV± 2.0 kV
    10158159163149
    33174169175174
    82189198180190
    100380385352377
    Table 2. The rise time of output waveform with different energy storage capacitor.
    Huai-Meng Gui, Wei Shi. Effect of capacitance on positive and negative symmetric pulse with fast rising edge based on GaAsphotoconductive semiconductor switch[J]. Acta Physica Sinica, 2019, 68(19): 194206-1
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