• Opto-Electronic Engineering
  • Vol. 33, Issue 6, 28 (2006)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Validation of diffusion equation photon transport model in optical tomography using MC method[J]. Opto-Electronic Engineering, 2006, 33(6): 28 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. Validation of diffusion equation photon transport model in optical tomography using MC method[J]. Opto-Electronic Engineering, 2006, 33(6): 28
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