• Journal of Applied Optics
  • Vol. 44, Issue 4, 852 (2023)
Chao CHEN*, Bin YANG, Dongyu YU, Wanhong YIN..., Jingzhu GONG, Hui LI, Nanxi WANG and Ke YANG|Show fewer author(s)
Author Affiliations
  • Xi'an Institute of Applied Optics, Xi'an 710065, China
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    DOI: 10.5768/JAO202344.0403006 Cite this Article
    Chao CHEN, Bin YANG, Dongyu YU, Wanhong YIN, Jingzhu GONG, Hui LI, Nanxi WANG, Ke YANG. Automatic measurement device of laser-induced damage threshold and its experiment[J]. Journal of Applied Optics, 2023, 44(4): 852 Copy Citation Text show less
    References

    [2] LIU Zhichao, ZHEN Yi, WU Qian, Single-shot large beam laser induced damage threshold measurement on dielectric coatings[J]. High Power Laser and Particle Beams, 2015, 27(5): 052006-1-053006-6.

    [3] ALEXANDRU Z, LAURENTIU R, AUREL S, et al. Measuring the effective pulse duration of nanosecond and femtosecond laser pulses for laser-induced damage experiments[J], Optical Engineering, 2013, 52(5): 054203-1-054203-10.

    [4] Technical Committee ISO/TC 172, Laser and laser-related equipment—Test methods foe laser-induced damage threshold—Part1: Definitions and general principles ISO 21254-1: 2011[S]. International Organization for Standardization, Geneva, Switzerland (2011).

    [5] Technical Committee ISO/TC 172, Laser and laser-related equipment—Test methods foe laser-induced damage threshold—Part2: Threshold determination ISO 21254-2: 2011 [S]. International Organization for Standardization, Geneva, Switzerland (2011).

    [15] General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China. Test method for laser damage threshold of lasers and laser-related equipment: GB/T16601—2007[S]. Beijing: Standards Press of China, 2017.

    [17] YE Depei. Measurement uncertainty[M]. Beijing: Defence Industry Press, 1996: 19-20.

    Chao CHEN, Bin YANG, Dongyu YU, Wanhong YIN, Jingzhu GONG, Hui LI, Nanxi WANG, Ke YANG. Automatic measurement device of laser-induced damage threshold and its experiment[J]. Journal of Applied Optics, 2023, 44(4): 852
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