• Acta Photonica Sinica
  • Vol. 49, Issue 1, 0112002 (2020)
Lian-tao ZHANG, Rong-sheng LU*, and Zi-yi CHENG
Author Affiliations
  • School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, China
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    DOI: 10.3788/gzxb20204901.0112002 Cite this Article
    Lian-tao ZHANG, Rong-sheng LU, Zi-yi CHENG. Measurement Technique of High-reflected Surface Based on Phase Measuring Deflectometry[J]. Acta Photonica Sinica, 2020, 49(1): 0112002 Copy Citation Text show less

    Abstract

    The direct measurement of the smooth and high-reflected surface was realized using images acquired by a single camera. Firstly, the image of the reference plane in the standard plane mirror was captured by the camera. Then, the depth distance of the mirror to be measured was obtained, by using the dense reflection correspondence between the points on the reference plane and the image points on the normalized imaging plane. Finally, the measurement of high-reflected surface was achieved. The high-reflected surface was measured by finding the "intersection point" between the camera ray beam and the corresponding incident ray beam. The ray tracing was used to transform the measurement process into an intersection problem between the two corresponding ray bundles in the solution space. The normal fields of the surface were obtained and the corresponding reflected light beam was solved based on the surface profile gradient which is obtained by taking the phase information as the carrier. The standard plane mirror is tested and the measured flatness is 0.19 mm. The rearview mirror is detected by the traditional method and the method proposed in this paper, and the average distance between the corresponding points in the test result is 0.15 mm, which verifies the effectiveness of the method for detecting the mirror surface shape.
    Lian-tao ZHANG, Rong-sheng LU, Zi-yi CHENG. Measurement Technique of High-reflected Surface Based on Phase Measuring Deflectometry[J]. Acta Photonica Sinica, 2020, 49(1): 0112002
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