• Journal of Applied Optics
  • Vol. 44, Issue 2, 380 (2023)
Biao ZHANG1,*, Jinyu ZHANG2, Xiao JI1, Yuanyuan DUAN1..., Lei WU1, Gaoping LI1, Dongyu YU1 and Wanhong YIN1|Show fewer author(s)
Author Affiliations
  • 1The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
  • 2College of Optical and Electronic Science Technology, China Jiliang University, Hangzhou 310018, China
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    DOI: 10.5768/JAO202344.0203003 Cite this Article
    Biao ZHANG, Jinyu ZHANG, Xiao JI, Yuanyuan DUAN, Lei WU, Gaoping LI, Dongyu YU, Wanhong YIN. Error analysis of precision scanning system for measuring reflectivity of large-aperture optical elements[J]. Journal of Applied Optics, 2023, 44(2): 380 Copy Citation Text show less
    References

    [1] International Organization for Standardization. Measurement of reflectance of plane surfaces and transmittance of plans parallel elements: ISO 15368 [S]. Switzerland: Information Handlng Services, 2001.

    [7] SUN Fuge, DAI Dongxu, XIE Jinchun, et al. Accurate measurement of reflectivity of high mirror by cavity ring-down spectroscopy [J]. Chinese journal of lasers, 1999, 26 (1) : 35-38.

    Biao ZHANG, Jinyu ZHANG, Xiao JI, Yuanyuan DUAN, Lei WU, Gaoping LI, Dongyu YU, Wanhong YIN. Error analysis of precision scanning system for measuring reflectivity of large-aperture optical elements[J]. Journal of Applied Optics, 2023, 44(2): 380
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