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    Journals >Chinese Journal of Lasers >Volume 11 >Issue 6 >Page 359 > Article
    • Chinese Journal of Lasers
    • Vol. 11, Issue 6, 359 (1984)
    [in Chinese]
    Fu Rulian, Kai Guiyun, Yang Mengyan, and Geng Xikun
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    Fu Rulian, Kai Guiyun, Yang Mengyan, Geng Xikun. [J]. Chinese Journal of Lasers, 1984, 11(6): 359 Copy Citation Text show less

    Abstract

    By 150 W CW CO2 laser beam irradiation, the elimination of the oxidation stacking faults in silicon has been observed and its mechanism is discussed.
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    Fu Rulian, Kai Guiyun, Yang Mengyan, Geng Xikun. [J]. Chinese Journal of Lasers, 1984, 11(6): 359
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    Paper Information
    Recommended Topics
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