The critical findings associated with end-face total internal reflection (TIR) phenomemon we proved before are reported. In particular, these findings reveal that the end-face-TIR capable rays experience enormous mode mixing when encountering a roughened end face. As a result, 94% of the overall detectable power is contributed by this effect. With a smooth fiber end face, this figure is mere 52%. We interpret the mechanism behind these unusual phenomena and its significance for the performance enhancement of fiber optic evanescent wave sensor.