Improved electrical properties of NO-nitrided SiC/SiO2 interface after electron irradiation

Ji-Long Hao; Yun Bai; Xin-Yu Liu; Cheng-Zhan Li; Yi-Dan Tang; Hong Chen; Xiao-Li Tian; Jiang Lu; Sheng-Kai Wang

doi:10.1088/1674-1056/ab9434

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