Author Affiliations
1Department of Basic Courses, Rocket Forces Engineering University, Xi’an 710025, China2College of Liberal Arts and Sciences, National University of Defense Technology, Changsha 410073, Chinashow less
Fig. 1. (a) Picture of SLs chip; (b) schematic representation of the SLs device; (c) energy band diagram of SLs; (d) the models of high and low field domain and sequential tunneling of SLs.
Fig. 2. Schematic for high speed physical random number generator of SLs (HAPS, high accuracy powersupply; BT, Bias-Tee; SLs, superlattices; L, inductance (unit Lenz); C, capacitance; OSC, oscilloscope; VNA, vector network analyzer; ADC, analog digital converter; FPGA, field programmable gate array).
Fig. 3. I-Vcharacteristic curve of SLs.
Fig. 4. Superlattices: (a) Temporal waveform of single peak signal; (b) temporal waveform of bimodal signal; (c) temporal waveform of non-periodic signal; (d) power spectrum of single peak signal; (e) power spectrum of single bimodal signal; (f) power spectrum of single non-periodic signal.
Fig. 5. Autocorrelation curve of SLs.
Fig. 6. (a) The maximum Lyapunov exponents of the superlattices signal at different voltages; (b) the phase space of the superlattices signal.
Fig. 7. M-bit effective probability density distribution: (a) m = 8; (b) m = 6; (c) m = 5; (d) m = 4.
Fig. 8. acquisition scheme of SLs: (a) Schematic diagram of acquisition conversion; (b) schematic diagram of postprocessing.
Fig. 9. Results of NIST for superlatticesrandom numbers at different Les.
统计测试 | P值
| 通过百分比 | 结果 | 频率测试 | 0.514124 | 0.995 | 通过 | 块内频率测试 | 0.966244 | 0.990 | 通过 | 累加和测试 | 0.981609 | 0.993 | 通过 | 游程测试 | 0.782040 | 0.993 | 通过 | 块内长游程测试 | 0.657933 | 0.996 | 通过 | 二进制矩阵秩测试 | 0.379555 | 0.992 | 通过 | 离散傅里叶变换测试 | 0.196920 | 0.985 | 通过 | 非重叠模块匹配测试 | 0.938463 | 0.988 | 通过 | 重叠块比配测试 | 0.224821 | 0.987 | 通过 | 全局通用统计测试 | 0.513309 | 0.989 | 通过 | 近似熵测试 | 0.955835 | 0.998 | 通过 | 随机游动测试 | 0.637119 | 0.985 | 通过 | 随机游动变量测试 | 0.324180 | 0.986 | 通过 | 串行测试 | 0.637119 | 0.982 | 通过 | 线性复杂度测试 | 0.414525 | 0.995 | 通过 |
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Table 1. Results of NIST statistical test.