• Optics and Precision Engineering
  • Vol. 18, Issue 7, 1548 (2010)
LU Qi-peng1,*, MA Lei1,2, and PENG Zhong-qi1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LU Qi-peng, MA Lei, PENG Zhong-qi. Rotation-angle-accuracy measurement of scanning mechanism in variable included angle plane grating monochromater[J]. Optics and Precision Engineering, 2010, 18(7): 1548 Copy Citation Text show less
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    [8] KAZNACHEYVE K V, BLOMQVIST I, HALLIN E, et al.. Hitchcock. Principles of optical design of the SM beamline at the CLS[J]. AIP Conference Proceedings, 2004,705:1303-1307.

    [9] MATSUSHITA T, MAEZAWA H, ISHIKAWA T, et al.. New multipole wigglet/undulator beamline(BL-16)at the Photon Factory[J]. Sci.Instr, 1989,60(7):1874-1876.

    [10] NYHOLM R N,ANDERSEN J, JOHANSSON U. Beamline I311 at MAX-LAB: a VUV/soft X-ray undulator beamline for high resolution electron spectroscopy[J]. Nucl. Instr.Meth, 2001,A467:520-524.

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    LU Qi-peng, MA Lei, PENG Zhong-qi. Rotation-angle-accuracy measurement of scanning mechanism in variable included angle plane grating monochromater[J]. Optics and Precision Engineering, 2010, 18(7): 1548
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