• Frontiers of Optoelectronics
  • Vol. 1, Issue 1, 197 (2008)
Wei CHEN1、*, Hanmin YAO2, Fan WU2, Shibin WU2, and Qiang CHEN2
Author Affiliations
  • 1Xi’an University of Science and Technology, Xi’an 710054, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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    DOI: 10.1007/s12200-008-0032-2 Cite this Article
    Wei CHEN, Hanmin YAO, Fan WU, Shibin WU, Qiang CHEN. Power spectral density measurement for large aspheric surfaces[J]. Frontiers of Optoelectronics, 2008, 1(1): 197 Copy Citation Text show less
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    Wei CHEN, Hanmin YAO, Fan WU, Shibin WU, Qiang CHEN. Power spectral density measurement for large aspheric surfaces[J]. Frontiers of Optoelectronics, 2008, 1(1): 197
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