• Frontiers of Optoelectronics
  • Vol. 1, Issue 1, 197 (2008)
Wei CHEN1、*, Hanmin YAO2, Fan WU2, Shibin WU2, and Qiang CHEN2
Author Affiliations
  • 1Xi’an University of Science and Technology, Xi’an 710054, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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    DOI: 10.1007/s12200-008-0032-2 Cite this Article
    Wei CHEN, Hanmin YAO, Fan WU, Shibin WU, Qiang CHEN. Power spectral density measurement for large aspheric surfaces[J]. Frontiers of Optoelectronics, 2008, 1(1): 197 Copy Citation Text show less

    Abstract

    To ensure the safe and normal operation of the whole optical system, it is important to test and evaluate the quality of optical components. The article explores the advantages and disadvantages of general parameters used in aspheric surface testing, the composition of the system, the principle of operation and the design of related power spectral density (PSD) software used in testing large aspheric surfaces with Shack-Hartmann and phase shifting interferometer. The results indicate that PSD can give the spatial frequency distribution of the wavefront aberration when large aperture phase shifting interferometer is used as an instrument to test the wavefront, and this can also be applied as an evaluation standard in testing the quality of optical components. In addition, this paper describes the test results of optical components in the size of 64 mm×64 mm.
    Wei CHEN, Hanmin YAO, Fan WU, Shibin WU, Qiang CHEN. Power spectral density measurement for large aspheric surfaces[J]. Frontiers of Optoelectronics, 2008, 1(1): 197
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