• Experiment Science and Technology
  • Vol. 23, Issue 1, 82 (2025)
Shuguang YAN1, Suilin LIU1, Rui LIU2, Hongjie SONG2,*, and Yi LYU1,2
Author Affiliations
  • 1Analytical and Testing Center, Sichuan University, Chengdu 610064, China
  • 2College of Chemistry, Sichuan University, Chengdu 610064, China
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    DOI: 10.12179/1672-4550.20230483 Cite this Article
    Shuguang YAN, Suilin LIU, Rui LIU, Hongjie SONG, Yi LYU. Study on the Radiation-Induced Sample Damage in X-Ray Photoelectron Spectroscopy[J]. Experiment Science and Technology, 2025, 23(1): 82 Copy Citation Text show less
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    [12] S KUNDU, M J SCHAIBLE, A D MCKEE et al. Direct damage of deoxyadenosine monophosphate by low-energy electrons probed by X-ray photoelectron spectroscopy. The Journal of Physical Chemistry B, 124, 1585-1591(2020).

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    Shuguang YAN, Suilin LIU, Rui LIU, Hongjie SONG, Yi LYU. Study on the Radiation-Induced Sample Damage in X-Ray Photoelectron Spectroscopy[J]. Experiment Science and Technology, 2025, 23(1): 82
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