• Electronics Optics & Control
  • Vol. 20, Issue 3, 53 (2013)
SHI Xuehu, WU Xiaoyang, and WANG Yingrui
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2013.03.012 Cite this Article
    SHI Xuehu, WU Xiaoyang, WANG Yingrui. Summarization of Testing Systems for Low-Background Infrared Cryogenic Chamber[J]. Electronics Optics & Control, 2013, 20(3): 53 Copy Citation Text show less
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