Absolute surface form measurement of flat optics based on oblique incidence method

Longbo Xu; Shijie Liu; Rihong Zhu; You Zhou; Jie Chen

doi:10.3788/COL201816.101201

Journals >Chinese Optics Letters >Volume 16 >Issue 10 >Page 101201 > Article

Chinese Optics Letters
Vol. 16, Issue 10, 101201 (2018)

Absolute surface form measurement of flat optics based on oblique incidence method

Longbo Xu¹, Shijie Liu^2,*, Rihong Zhu^1,**, You Zhou², and Jie Chen²

Author Affiliations

¹Nanjing University of Science and Technology, Nanjing 210094, China

²Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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DOI: 10.3788/COL201816.101201 Cite this Article Set citation alerts

Longbo Xu, Shijie Liu, Rihong Zhu, You Zhou, Jie Chen, "Absolute surface form measurement of flat optics based on oblique incidence method," Chin. Opt. Lett. 16, 101201 (2018) Copy Citation Text

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Longbo Xu, Shijie Liu, Rihong Zhu, You Zhou, Jie Chen, "Absolute surface form measurement of flat optics based on oblique incidence method," Chin. Opt. Lett. 16, 101201 (2018)

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