Absolute surface form measurement of flat optics based on oblique incidence method

Longbo Xu; Shijie Liu; Rihong Zhu; You Zhou; Jie Chen

doi:10.3788/COL201816.101201

Journals >Chinese Optics Letters >Volume 16 >Issue 10 >Page 101201 > Article

Chinese Optics Letters
Vol. 16, Issue 10, 101201 (2018)

Absolute surface form measurement of flat optics based on oblique incidence method

Longbo Xu¹, Shijie Liu^2、*, Rihong Zhu^1、**, You Zhou², and Jie Chen²

Author Affiliations

¹Nanjing University of Science and Technology, Nanjing 210094, China

²Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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DOI: 10.3788/COL201816.101201 Cite this Article Set citation alerts

Longbo Xu, Shijie Liu, Rihong Zhu, You Zhou, Jie Chen. Absolute surface form measurement of flat optics based on oblique incidence method[J]. Chinese Optics Letters, 2018, 16(10): 101201 Copy Citation Text

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Longbo Xu, Shijie Liu, Rihong Zhu, You Zhou, Jie Chen. Absolute surface form measurement of flat optics based on oblique incidence method[J]. Chinese Optics Letters, 2018, 16(10): 101201

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