• Optics and Precision Engineering
  • Vol. 18, Issue 1, 37 (2010)
LIU Jun-yan1,2,*, DAI Jing-min2, and WANG Yang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LIU Jun-yan, DAI Jing-min, WANG Yang. Thermal wave detection and defect depth measurement based on lock-in thermography[J]. Optics and Precision Engineering, 2010, 18(1): 37 Copy Citation Text show less
    References

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    [3] LI Y H, ZHAO Y J, FENG L CH, et al.. Measurement defect depth by infrared thermal wave nondestructive evaluation by pulse phase [J]. Opt. Precision Eng.,2008,16(1):55-58.(in Chinese )

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    LIU Jun-yan, DAI Jing-min, WANG Yang. Thermal wave detection and defect depth measurement based on lock-in thermography[J]. Optics and Precision Engineering, 2010, 18(1): 37
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