[in Chinese], [in Chinese]. DDI Method for Measuring Optical Constants of Thin Films[J]. Chinese Journal of Lasers, 1996, 23(10): 915
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By a double-beam and double-wave interferometric (DDI) method, the opticalconstants of thin films, i. e. refractive index, extinction coefficient and thickness may bedetermined in infrared (3.39um) and visible (0.633 um) ranges at the same optical pathwith a tunalbe double wave He-Ne laser designed by ourselves. The measuring principle andthe device are described.