Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Electronics Optics & Control >Volume 22 >Issue 4 >Page 92 > Article
    • Electronics Optics & Control
    • Vol. 22, Issue 4, 92 (2015)
    Error Tracing of Dynamic Measurement System Based on EMD and Error Matching
    WU Xiao-min, LI Shi-ping, and CHENG Shuang-jiang
    Author Affiliations
  • [in Chinese]
    • show less
    DOI: 10.3969/j.issn.1671-637x.2015.04.021 Cite this Article
    WU Xiao-min, LI Shi-ping, CHENG Shuang-jiang. Error Tracing of Dynamic Measurement System Based on EMD and Error Matching[J]. Electronics Optics & Control, 2015, 22(4): 92 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    WU Xiao-min, LI Shi-ping, CHENG Shuang-jiang. Error Tracing of Dynamic Measurement System Based on EMD and Error Matching[J]. Electronics Optics & Control, 2015, 22(4): 92
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology