Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment&#39;s Test Resource

DU Minjie; CAI Jinyan; LIU Limin

doi:10.3969/j.issn.1671-637x.2013.01.017

Journals >Electronics Optics & Control >Volume 20 >Issue 1 >Page 74 > Article

Electronics Optics & Control
Vol. 20, Issue 1, 74 (2013)

Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource

DU Minjie, CAI Jinyan, and LIU Limin

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[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2013.01.017 Cite this Article

DU Minjie, CAI Jinyan, LIU Limin. Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource[J]. Electronics Optics & Control, 2013, 20(1): 74 Copy Citation Text

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References

[1] RAGHURAJ R，BHUSHAN M，RENGASWAMY R.Locating sensors in complex chemical plants based on fault diagnostic observability criteria［J］.American Institute of Chemistry Engineering Journal，1999，45(2):310-322.

[3] BAGAJEWICZ M，FUXMAN A，URIBE A.Instrumentation network design and upgrade for process monitoring and fault detection［J］.American Institute of Chemistry Engineering Journal，2004，50(8):1870-1880.

[7] FIJANY A，VATAN F.A new efficient algorithm for analyzing and optimizing the system of sensors［C］//IEEE Aerospace Conference，2006：1-8.

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[1] HU Yixin, SUN Yigang, ZHAO Zhen. Application of Hybrid PSO-SQP Algorithm in Testability Allocation of Avionics System,[J]. Electronics Optics & Control, 2021, 28(5): 60

DU Minjie, CAI Jinyan, LIU Limin. Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource[J]. Electronics Optics & Control, 2013, 20(1): 74

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