[1] MARSEGUERRA M, ZIO E, CIPOLLONE M. Designing optimal degradation tests via multi-objective genetic algorithms［J］. Reliability Engineering & System Safety, 2003, 79(1): 87-94.

[2] YUAN X X, PANDEY M D. A nonlinear mixed-effects model for degradation data obtained from in-service inspections［J］. Reliability Engineering & System Safety, 2009, 94(2): 509-519.

[3] FAN J, YUNG K C, PECHT M. Predicting long-term lumen maintenance life of LED light sources using a particle filter-based prognostic approach［J］. Expert Systems with Applications, 2015, 42(5): 2411-2420.

[4] XIAO Cheng-di, LIU Chun-hui, LIU Wei-dong, et al. Reliability assessment of LED lamp based on acceleration degradation test［J］. Chinese Journal of Luminesence, 2014, 35(9): 1143-1151.

[5] CHAN S I, HONG W S, KIM K T, et al. Accelerated life test of high power white light emitting diodes based on package failure mechanisms［J］. Microelectronics Reliability, 2011, 51(9-11): 1806-1809.

[6] LEVADA S, MENEGHINI M, MENEGHESSO G, et al. Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model［J］. IEEE Transactions on Device and Materials Reliability, 2005, 5(4): 688-693.

[7] FAN J, YUNG K C, PECHT M. Prognostics of lumen maintenance for high power white light emitting diodes using a nonlinear filter-based approach［J］. Reliability Engineering & System Safety, 2014, 123(0): 63-72.

[8] TREVISANELLO L, MENEGHINI M, MURA G, et al. Accelerated life test of high brightness light emitting diodes［J］. IEEE Transactions on Device and Materials Reliability, 2008, 8(2): 304-311.

[9] NARENDRAN N, GU Y, FREYSSINIER J P, et al. Solid-state lighting: Failure analysis of white LEDs［J］. Journal of Crystal Growth, 2004, 268(3-4): 449-456.

[10] GUO Chun-sheng, ZHANG Yan-feng, WAN Ning, et al. The investigation of LED degradation model based on the chemical kinetics［J］. Acta Physica Sinica, 2013, 62(21): 468-473.

[11] GUO Wei-ling, FAN Xing, CUI De-sheng, et al. Rapid reliability evaluation method of LED based on pseudo-failure lifetime［J］. Chinese Journal of Luminesence, 2013, 34(2): 213-217.

[12] SHENG Hai-ping. Research on reliability predietion mechanism for high-power LEDs［D］. Zhejiang： Zhejiang University, 2008: 92-95.

[13] NARENDRAN N, GU Y. Life of LED-based white light sources［J］. Journal of Display Technology, 2005, 1(1): 167-171.

[14] CUI De-sheng, GUO Wei-ling, CUI Bi-feng, et al. Early degradation of GaN-based power LED under electrical stresses［J］. Chinese Journal of Luminesence, 2012, 33(1): 93-96.

[15] ZHOU Jing-rong. Intelligent dimmer mathematical model of white light LED［J］. Chinese Journal of Luminescence, 2015, 36(8): 953-956.

[16] PARSONS F G, WIRSCHING P H. A Kolmogorov-Smirnov goodness-of-fit test for the two-parameter weibull distribution when the parameters are estimated from the data［J］. Microelectronics Reliability, 1982, 22(2): 163-167.

[17] BAKLIZI A. Weighted Kolmogrov-Smirnov type tests for grouped Rayleigh data［J］. Applied Mathematical Modelling, 2006, 30(5): 437-445.

[18] MORA-LOPEZ L, MORA J. An adaptive algorithm for clustering cumulative probability distribution functions using the Kolmogorov–Smirnov two-sample test［J］. Expert Systems with Applications, 2015, 42(8): 4016-4021.

[19] ZHANG Jian-ping, WU Li-wen, ZHOU Yan-jun, et al. Life prediction for infrared LED based on MLE under lognormal distribution［J］. Chinese Journal of Liquid Crystals and Display, 2011, 26(1): 68-72.