• Advanced Photonics
  • Vol. 5, Issue 2, 020501 (2023)
Luca Pezzè1、2
Author Affiliations
  • 1Istituto Nazionale di Ottica, INO-CNR, Firenze, Italy
  • 2European Laboratory for Nonlinear Spectroscopy, LENS, Sesto Fiorentino, Italy
  • show less
    DOI: 10.1117/1.AP.5.2.020501 Cite this Article Set citation alerts
    Luca Pezzè. Machine learning for optical quantum metrology[J]. Advanced Photonics, 2023, 5(2): 020501 Copy Citation Text show less
    A general quantum metrology device consists of quantum state preparation, parameter-encoding evolution and measurement. Here, the device is equipped with an ML agent. The agent associates to each measurement result μ a Bayesian distribution P(ϕ|μ) obtained from a neural network trained with calibration data. When acquiring repeated measurement with results μ1,…μm, Bayesian distributions are multiplied, updating the prior knowledge about the unknown parameter ϕT. Finally, the agent chooses computes a phase ϕC for an adaptive feedback control of the device. Notice that ϕT and ϕC can be single- (as in the schematic here) or multivalued (as in the experiment of Cimini et al.17" target="_self" style="display: inline;">17).
    Fig. 1. A general quantum metrology device consists of quantum state preparation, parameter-encoding evolution and measurement. Here, the device is equipped with an ML agent. The agent associates to each measurement result μ a Bayesian distribution P(ϕ|μ) obtained from a neural network trained with calibration data. When acquiring repeated measurement with results μ1,μm, Bayesian distributions are multiplied, updating the prior knowledge about the unknown parameter ϕT. Finally, the agent chooses computes a phase ϕC for an adaptive feedback control of the device. Notice that ϕT and ϕC can be single- (as in the schematic here) or multivalued (as in the experiment of Cimini et al.17).