The bad pixel is one of the important indexes to measure the photoelectric performance of infrared detectors which is caused by material, technology and some other factors. In this paper, a line-scanning HgCdTe infrared detector is taken as the research object, and the bad pixel types of the detector are analyzed by various bad pixel detection methods. The analysis results are taken as the basis for accurately determining the number and location of bad pixels. By replacing the bad pixels, the images with good quality are obtained.