• Optics and Precision Engineering
  • Vol. 16, Issue 7, 1223 (2008)
YAN Yong-da1,2,*, FEI Wei-dong1, HU Zhen-jiang2, CHENG Xiang-jie2..., SUN Tao2 and DONG Shen2|Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    YAN Yong-da, FEI Wei-dong, HU Zhen-jiang, CHENG Xiang-jie, SUN Tao, DONG Shen. SCM-based nanomechanical property measurement system of AFM[J]. Optics and Precision Engineering, 2008, 16(7): 1223 Copy Citation Text show less
    References

    [1] VANLANDINGHAN M R,MCKNIGHT S H,PALMESE G R,et al..Nanoscale indentation of polymer systems using the atomic force microscope[J].Journal of Adhesion,1997,64:31-59

    [2] SUNDARARAJAN S,BHUSHAN B,NAMAZU T,et al..Mechanical property measurements of nanoscale structures using an atomic force microscope[J].Ultramicroscopy,2002,91(1-4):111-118

    [3] KOJIM I,XU W T,FUJIMOTO T.Nanohardness measurement of carbon nitride thin films[J].Surf.Interface Ana.,2001,32:74-78

    [8] OLIVER W C,PHARR G M.Measurement of hardness and elastic modulus by instrumented indentation:advance in understanding and refinements to methodology[J].J.Mater Res.,2004,19(1):3-20

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    YAN Yong-da, FEI Wei-dong, HU Zhen-jiang, CHENG Xiang-jie, SUN Tao, DONG Shen. SCM-based nanomechanical property measurement system of AFM[J]. Optics and Precision Engineering, 2008, 16(7): 1223
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