• Chinese Journal of Lasers
  • Vol. 28, Issue 7, 637 (2001)
[in Chinese]1, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese]. High Precision Straightness Device Based on Double-frequency Laser Interference Technique[J]. Chinese Journal of Lasers, 2001, 28(7): 637 Copy Citation Text show less

    Abstract

    A high precision straightness standard device based on double frequency laser interference and edge reverse techniques was presented in this paper, in which the laser wave length was taken as the measuring datum. This device which could get the accuracy over 0.1 μm/m under common lab condition was applied in astronautics calibration laboratory.
    [in Chinese], [in Chinese], [in Chinese]. High Precision Straightness Device Based on Double-frequency Laser Interference Technique[J]. Chinese Journal of Lasers, 2001, 28(7): 637
    Download Citation