[1] Pohl D W,Denk W,Lanz M. Optical stethoscopy: image recording with resolution λ/20.Appl Phys Lett,1984,44(7):651～653

[2] Betzig E,Finn P L,Weiner J S. Combined shear force and near-field scanning optical microscopy. Appl Phys Lett,1992,60(20):2484～2486

[3] Michael A P,Patrick J M. Near-field optical theory,instrumentation and applications. John Wiley & Sons,Inc,New York,1996

[4] Zhang S L. Scanning Near-Field Optical Microscopy and Its Applications. Beijing:Science Press,2000.95

[5] Trautman J K,Betzig E,Weiner J S,etal.Image contrast in near-field optics. J Appl Phys,1992,71(10) :4659～4663

[6] Bozhevolnyi S I,Smolyaninov I,Keller O. Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback. Appl Opt,1995,34(19) :3793～3799

[7] Carminati R,Greffet J J. Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface. J Opt Soc Am,1995,A12 (12):2716～2725

[8] Martin O J F,Girard C,Deraux A. Dielctric versus topographic contrast in near-field microscopy. J Opt Soc Am,1996,A13(9):1801～1807

[9] Valle P J,Greffet J J,Carminati R. Optical contrast,topographic contrast and artifacts in illumination-mode scanning near-field optical microscopy. J Appl Phys,1999,86(1):648～656

[10] Wang X E,Fan Z Z,Zhang L,et al. Acta Phontonica Sinica,2004,33(8) :912～915

[11] Fan Z Z,Wang X E,Tang T T. Study on the near-field optical properties of metal-clad cutting-off fiber probe with a sub-wavelength aperture. Optik,2004,115 (3):133～139

[12] Wang X E,Fan Z Z,Tang T T. Study on the poser transmission and light spot size of optical probes in scanning near-field optical microscopes. Opt Commun,2004,235(1):31～40