• Chinese Journal of Lasers
  • Vol. 26, Issue 1, 21 (1999)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of a High Precision Phase Shifter Employed in Phase Shifting Metrology[J]. Chinese Journal of Lasers, 1999, 26(1): 21 Copy Citation Text show less

    Abstract

    Phase shifting is the key technique in phase shifting interference metrology and it greatly effects the measuring precision even results in a failure. A high precision phase shifter is presented in this paper. The error of the output voltage is less than 0.1% and the error of the phase shifter is less than 3 degrees. The ESPI measuring system with the phase shifter described in this paper can reach a precision of λ/100.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study of a High Precision Phase Shifter Employed in Phase Shifting Metrology[J]. Chinese Journal of Lasers, 1999, 26(1): 21
    Download Citation