• Chinese Journal of Lasers
  • Vol. 44, Issue 9, 901011 (2017)
Xiong Jun*, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, and Lei Anle
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/CJL201744.0901011 Cite this Article Set citation alerts
    Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 901011 Copy Citation Text show less

    Abstract

    Multi-keV X-rays are used as backlighting sources of the radiography to diagnose plasmas in high energy density physics (HEDP) experiments. We study the characteristics of Ti-4.7 keV and Cl-2.7 keV X-rays driven by nanosecond laser at the SG-II laser facility. The results show that the X-rays from Cl plasma are primarily He-like and H-like line radiation, with 2.7 keV He-α line on the strongest line emission. In addition, the relative intensity of Cl X-rays is more than an order of magnitude compared to that of Ti X-rays under the current SG-II laser conditions. Therefore, the Cl X-rays can be used as the backlighting diagnosis.
    Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 901011
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