• Chinese Optics Letters
  • Vol. 8, Issue s1, 99 (2010)
Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, and Yi Yin
Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China
  • show less
    DOI: 10.3788/COL201008s1.0099 Cite this Article Set citation alerts
    Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, Yi Yin. Dispersive white-light spectral interferometer for optical properties measurement of optical thin films[J]. Chinese Optics Letters, 2010, 8(s1): 99 Copy Citation Text show less
    References

    [1] V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, Opt. Express 17, 7943 (2009).

    [2] P. Hlubina, D. Ciprian, J. Lunacek, and M. Lesnak, Opt. Express 14, 7678 (2006).

    [3] H. Xue, W. Shen, P. Gu, Z. Luo, Y. Zhang, and X. Liu, Chin. Opt. Lett. 7, 446 (2009).

    [4] P. Hlubina, J. Lunacek, and D. Ciprian, Opt. Lett. 34, 1564 (2009).

    [5] A. Gosteva, M. Haiml, R. Paschotta, and U. Keller, J. Opt. Soc. Am. B 22, 1868 (2005).

    [6] T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, Appl. Opt. 48, 949 (2009).

    [7] K. Alexander, F. Chau, and J. B. Gao, Ana. Chem. 70, 5222 (1998).

    [8] J. W. Luo, J. Bai, and J. H. Shao, Prog. Nat. Sci. 16, (2006).

    Zhengyue Luo, Xu Liu, Shuna Zhang, Weidong Shen, Cen Xia, Yi Yin. Dispersive white-light spectral interferometer for optical properties measurement of optical thin films[J]. Chinese Optics Letters, 2010, 8(s1): 99
    Download Citation