• Chinese Journal of Lasers
  • Vol. 47, Issue 9, 910001 (2020)
Yao Pingping1、2, Xu Sunlong1、2, Tu Bihai1、2, Yu Xinyu1、2, Cui Shanshan1、2, Luo Donggen1、2, and Hong Jin1、2
Author Affiliations
  • 1Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 2Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences,Hefei, Anhui 230031, China
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    DOI: 10.3788/CJL202047.0910001 Cite this Article Set citation alerts
    Yao Pingping, Xu Sunlong, Tu Bihai, Yu Xinyu, Cui Shanshan, Luo Donggen, Hong Jin. Design of Performance Test System and Analysis of Temperature Dependence for Space-Borne Array CCD[J]. Chinese Journal of Lasers, 2020, 47(9): 910001 Copy Citation Text show less
    Schematic of electro-optical test system of array CCD
    Fig. 1. Schematic of electro-optical test system of array CCD
    Block diagram of array CCD image acquisition system
    Fig. 2. Block diagram of array CCD image acquisition system
    Schematic of cooling system of array CCD detector
    Fig. 3. Schematic of cooling system of array CCD detector
    Integrating sphere illumination non-uniformity test result
    Fig. 4. Integrating sphere illumination non-uniformity test result
    Refrigeration control results. (a) Temperature control curve; (b) different working temperatures
    Fig. 5. Refrigeration control results. (a) Temperature control curve; (b) different working temperatures
    Curves of dark current and temperature
    Fig. 6. Curves of dark current and temperature
    QE curves change results at different working temperatures
    Fig. 7. QE curves change results at different working temperatures
    QE of DPC under different working temperatures
    Fig. 8. QE of DPC under different working temperatures
    Wavelength /nm490565670763765865910Avarage
    Stability /%0.0360.0320.0490.0170.0600.0470.0140.036
    Table 1. Radiation stability test results of integrating sphere light source
    Requirement /ms0±0.0055±0.00575±0.005200±0.005300±0.005
    Measurement /ms05.002975.0039200.0032300.0021
    Table 2. Measurement results of integration time accuracy
    Wavelength /nm443490565670763765865910
    PRNU /%2.761.881.622.072.362.032.622.73
    Manufacturer data /%2.8(400 nm)--2.5(650 nm)---2.8(900 nm)
    Limits≤3%≤5%
    Table 3. Measurement results of inconsistency of light response at different wavelengths
    ParameterUnitResultManufacturer dataLimit
    SystemgaDN·electron-10.025-≤0.049
    Saturation gray valueDN3200-≥2000
    Full well capacity1×103 electron ·pixel-1128120≥80
    Readout noiseelectron2.9802.9≤4
    Max signal noise ratio346-≤357
    Dark currentelectron·pixel-1·s-11011.77611186 ℃,≤5779.5
    Dark signal nonuniformityelectron·pixel-1·s-1202676 ℃,≤578
    Defect pixel (white spot, black spot)00≤50
    Table 4. Photoelectric performance parameter test results of detector
    ParameterWavelength /nmUnitResultManufacturer dataLimit
    Linearity rrror443%0.73-≤1
    4900.23
    5650.40
    6700.30
    7630.62
    7650.19
    8650.15
    9100.30
    QE400%57.8961.8≥40
    50089.6090.7≥80
    65087.7789.5≥80
    90027.0329.6≥25
    Table 5. Detector optical response nonlinearity and QE test results
    Yao Pingping, Xu Sunlong, Tu Bihai, Yu Xinyu, Cui Shanshan, Luo Donggen, Hong Jin. Design of Performance Test System and Analysis of Temperature Dependence for Space-Borne Array CCD[J]. Chinese Journal of Lasers, 2020, 47(9): 910001
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