• Acta Photonica Sinica
  • Vol. 35, Issue 2, 224 (2006)
Hao Dianzhong*, Wu Fuquan, Ma Lili, Yan Bin, and Zhang Xu
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    Hao Dianzhong, Wu Fuquan, Ma Lili, Yan Bin, Zhang Xu. Influence of Deposited Pressure on Refractive Index and Packing Density of ZrO2 Coatings by Electron Beam Evaporation[J]. Acta Photonica Sinica, 2006, 35(2): 224 Copy Citation Text show less

    Abstract

    ZrO2 coatings were prepared by electron beam evaporation at different deposition pressure,while deposition rate was monitored and demonstrated by quartz crystal oscillation. Used the new spectroscopic ellipsometer and spectrophotometer to test about the ZrO2 deposited spectral character and measure the film refractive index. Calculated the packing density of thin-film according to wavelength deviation dispersion theory before and after the thin-film suck tide. It was found that the refractive index and packing density were increasing as the working pressure was decreasing.
    Hao Dianzhong, Wu Fuquan, Ma Lili, Yan Bin, Zhang Xu. Influence of Deposited Pressure on Refractive Index and Packing Density of ZrO2 Coatings by Electron Beam Evaporation[J]. Acta Photonica Sinica, 2006, 35(2): 224
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