[1] C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

[2] M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Cambell, Proc. SPIE 1438, 376 (1989).

[3] M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

[4] L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

[5] E. Eva, K. Mann, N. Kaiser, B. Anton, R. Henking, D. Ristau, P. Weissbrodt, D. Mademann, L. Raupch, and E. Hacher, Appl. Opt. 35, 5613 (1996).

[6] Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

[7] M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

[8] P. A. Temple, W. H. Lowdermilk, D. Milam, and G. Kennedy, Appl. Opt. 21, 3249 (1982).

[9] J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

[10] X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

[11] D. Li, Y. Zhao, J. Shao, Z. Fan, and H. He, Chin. Opt. Lett. 6, 386 (2008).

[12] N. Bloembergeb, Appl. Opt. 12, 661 (1972).

[13] L. G. Deshazer, B. E. Newnam, and K. M. Leung, Appl. Phys. Lett. 23, 607 (1973).

[14] H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

[15] J. Capoulade, L. Gallais, J.-Y. Natoli, and M. Commandre, Appl. Opt. 47, 5272 (2008).

[16] J. O. Porteus and S. C. Seitel, Appl. Opt. 23, 3796 (1984).

[17] R. M. O'Connell, Appl. Opt. 31, 4143 (1992).

[18] J. Y. Natoli, L. Gallais, H. Akhouayri, and C. Amra, Appl. Opt. 41, 3156 (2002).

[19] ISO standard 11254-1, "Determination of laser-damage threshold of optical surfaces——part 1: 1-on-1 test" (2000).