• Chinese Optics Letters
  • Vol. 8, Issue 6, 598 (2010)
Xiao Li1、2, Xiaofeng Liu1、2, Yuan'an Zhao1, Jianda Shao1, and Zhengxiu Fan1
Author Affiliations
  • 1Key Laboratory of High Power Laser Material, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Graduate University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/COL20100806.0598 Cite this Article Set citation alerts
    Xiao Li, Xiaofeng Liu, Yuan'an Zhao, Jianda Shao, Zhengxiu Fan. Laser-conditioning mechanism of ZrO2/SiO2 HR films with fitting damage probability curves of laser-induced damage[J]. Chinese Optics Letters, 2010, 8(6): 598 Copy Citation Text show less

    Abstract

    The method of fitting damage probability curves of laser-induced damage is introduced to investigate the laser-conditioning mechanism of ZrO2/SiO2 high re°ection (HR) films. The laser-induced damage thresholds (LIDTs) of the sample are tested before and after the laser-conditioning scanning process. The parameters of the defects are obtained through the fitting process of the damage probability curve. It can be concluded that the roles of laser conditioning include two aspects: removing defects with lower threshold and producing new defects with higher threshold. The effect of laser conditioning is dependent on the competition of these two aspects.
    Xiao Li, Xiaofeng Liu, Yuan'an Zhao, Jianda Shao, Zhengxiu Fan. Laser-conditioning mechanism of ZrO2/SiO2 HR films with fitting damage probability curves of laser-induced damage[J]. Chinese Optics Letters, 2010, 8(6): 598
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