Author Affiliations
School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, Heilongjiang, Chinashow less
Fig. 1. Reconstructed images of two 200 nm stripes apart generated by different algorithms, density of the strip is 1 (above) and 51 (below), respectively
Fig. 2. Flowchart of SM algorithm, where the process of binary SNR generation, emitter identification and self-adaptation fitting algorithm are represented by yellow, blue and orange arrows, respectively
Fig. 3. Simulation data and algorithm comparison on simulation data. (a) Simulated images with different densities; (b) comparison of metrics of different algorithms; (c) localization error of different algorithms; (d) simulated reference image (ground truth,GT); (e) sectional intensity profiles and local magnification of reconstructed super-resolution images by different algorithms
Fig. 4. Algorithm comparison on experiment data. (a) rFRC maps of super-resolution images obtained from different algorithms; (b)‒(c) local magnification of super resolution images; (d) sectional intensity profile corresponding to white lines in Fig. 4(b)
Algorithm | RMSE | SSIM | PSNR |
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SE | 1.18×103 | 0.559 | 21 | SM | 0.78×103 | 0.699 | 23.93 | ME | 1.16×103 | 0.34 | 21.15 |
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Table 1. Comparison of super-resolution images recovered from different algorithms with ground truth image
Algorithm | Min /nm | Mean /nm | Max /nm |
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SE | 19.4 | 42.22 | 551.39 | SM | 19.4 | 34.45 | 100.82 | ME | 19.85 | 44.14 | 200.23 |
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Table 2. Quantitative resolution features of different algorithms given by rFRC
Algorithm | Mismatch error | Crosstalk error | Advantage density | Photo utilization efficiency | Computational complexity | Speed |
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SE | None | Much | Low | Low | Simple | High | ME | Much | Little | High | High | Complex | Low | SM | None | None | Full | High | Simple | Middle |
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Table 3. Comparison of SE, ME and SM algorithms