[1] K. B. Aime, C. Belin, L. Gallais, P. Grua, E. Fargin, J. Neauport, and I. Toven-Pecault, Opt. Express 17, 18703 (2009).

[2] C. Giuri, M. R. Perrone, and V. Piccinno, Appl. Opt. 36, 1143 (1997).

[3] Y. Xu, L. Zhang, D. Wu, Y. Sun, Z. Huang, X. Jiang, X. Wei, Z. Li, B. Dong, and Z. Wu, J. Opt. Soc. Am. B 22, 905 (2005).

[4] D. Zhang, C. Wang, P. Fan, X. Cai, Z. Zheng, J. Shao, and Z. Fan, Opt. Express 17, 8246 (2009).

[5] R. A. Negres, Z. M. Liao, G. M. Abdulla, D. A. Cross, M. A. Norton, and C. W. Carr, Appl. Opt. 50, D12 (2011).

[6] F. Dahmani, J. C. Lambropoulos, A. W. Schmid, S. Papernov, and S. J. Burns, Appl. Opt. 38, 6892 (1999).

[7] L. Gallais, P. Cormont, and J. L. Rullier, Opt. Express 17, 23488 (2009).

[8] Y. Z. Li, M. P. Harmer, and Y. T. Chou, J. Mater. Res. 9, 1780 (1994).

[9] D. Albagli, M. Dark, L. T. Perelman, C. von Rosenberg, I. Irzkan, and M. S. Feld, Opt. Lett. 19, 1684 (1994).

[10] J. E. Logan, N. A. Robertson, and J. Hough, Opt. Commun. 107, 342 (1994).

[11] F. Dahmani, A. W. Schmid, J. C. Lambropoulos, and S. Burns, Appl. Opt. 37, 7772 (1998).

[12] I. Santos, L. A. Marques, and L. Pelaz, Phys. Rev. B 74, 174115 (2006).

[13] C. T. Hansen, S. C. Wilks, and P. E. Young, Phys. Rev. Lett. 83, 5019 (1999).

[14] C. Barnes, P. Shrotriya, and P. Molian, Int. J. Mach. Tool. Manufact. 47, 1864 (2007).

[15] X. Zhang, E. J. Ashida, S. Shono, and F. Matsuda, J. Mater. Process. Technol. 174, 34 (2006).

[16] K. S. R. Chandran, Nature Mater. 4, 303 (2005).

[17] A. Furukawa and H. Tanaka, Nat. Mater. 8, 601 (2009).

[18] F. Dahmani, J. C. Lambropoulos, A. W. Schmid, S. Papernov, and S. J Burn, Appl. Opt. 38, 6892 (1999).