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    Journals >Electronics Optics & Control >Volume 23 >Issue 8 >Page 53 > Article
    • Electronics Optics & Control
    • Vol. 23, Issue 8, 53 (2016)
    Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation
    WANG Yan1, YUAN Lu1, NIE Xiao-liang2, and PENG Yan1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2016.08.012 Cite this Article
    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53 Copy Citation Text show less
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    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53
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