• Electronics Optics & Control
  • Vol. 23, Issue 8, 53 (2016)
WANG Yan1, YUAN Lu1, NIE Xiao-liang2, and PENG Yan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2016.08.012 Cite this Article
    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53 Copy Citation Text show less

    Abstract

    This paper briefly introduces the characteristics and test status of active decoy system, as well as decoying efficiency test requirements. The main problems of test pattern of active decoy hardware-in-the-loop simulation are discussed based on existing simulation resource extension. On the basis of the design idea of the overall process closed-loop countermeasure and situation simulation using real active decoy system and anti-radiation missiles, the active decoy hardware-in-the-loop simulation test pattern is established.
    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53
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