Researching | Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization

Journals >Acta Photonica Sinica >Volume 50 >Issue 12 >Page 1212004 > Article

Acta Photonica Sinica
Vol. 50, Issue 12, 1212004 (2021)

Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization

Li ZHENG, Chuang LIU^*, Jiaojiao REN, Dandan ZHANG, Lijuan LI, and Jisheng XU

Author Affiliations

Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology of Ministry of Education， College of Optoelectronic Engineering， Changchun University of Science and Technology， Changchun 130022， China

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DOI: 10.3788/gzxb20215012.1212004 Cite this Article

Li ZHENG, Chuang LIU, Jiaojiao REN, Dandan ZHANG, Lijuan LI, Jisheng XU. Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization[J]. Acta Photonica Sinica, 2021, 50(12): 1212004 Copy Citation Text

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References

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Li ZHENG, Chuang LIU, Jiaojiao REN, Dandan ZHANG, Lijuan LI, Jisheng XU. Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization[J]. Acta Photonica Sinica, 2021, 50(12): 1212004

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